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Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z
Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z

Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z

Product Code : SE7268
Brand: CATS
Availability: Đặt trước
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It is a system developed as a wafer measuring instrument by prober and can measure DC characteristics and L load test at one place. Unit management is also possible for measurement programs and measurement results, as well as a wafer map function.

 

 

 

 

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