di/dt Test Systems

di / d tester (MOS-FET, DIODE) GST 610 Z / GSTM 410 Z

The reverse recovery waveform and breakdown waveform of the MOS - FET and diode are taken from the oscilloscope, di / dt is obtained by software, and its characteristic is judged. OPEN / SHORT test, driver check function also has improved reliability.…

L Load Tester (MOS-FET, DIODE) GSTMLT 310 Z

Di / dt measurement and L load measurement were consolidated in one system. In order to emphasize the waveform characteristics, set the measurement part to the dedicated measurement terminal and perform the measurement.    Please click for more information.…