Diode test systems

Hard Breakdown Tester (DIODE) SZ 410 A

A constant current surge is applied for a certain time in the reverse direction of the diode to check the surge resistance of the diode.    Please click for more information.

High-speed surge destruction test equipment (DIODE) CV - 30 KB

CV - 30 KB is a tester which performs ESD test at ultrahigh voltage 30 kV and checks the deterioration state of the element by leak current measurement and withstand voltage measurement after that. Leak measurement is measured before and after the application…

IFSM test system (DIODE) IFRM 530 Z

IFRM 530 Z is a tester that obtains the forward surge current IFRM of the diode and guarantees the withstand capability.    Please click for more information.

IFSM tester (DIODE) IFSM-10ZZRPB

IFSM - 10ZZRPB guarantees IFSM withstand capability by continuously applying IFSM up to 1000 A and measuring the peak voltage value at that time. Up to 2 diode diodes can be used for measurement, and in case of 2 elements, continuous alternate measurement…

IFSM tester (DIODE) IFSM-45ZZ

IFSM - 45ZZ is a tester that applies IFSM up to 4500 A and guarantees IFSM withstand capability (single measurement only). The half wave time can be varied from 1.0 ms to 11.0 ms.    Please click for more information.

TRR tester (DIODE) TRR-M1A

TRR-M1A is selected with IF, IR current of 100 mA and 1A. Measurement range: 20 ns to 80.000 μs.    Please click for more information.

VFR tester (DIODE) VFR 510 Z

VFR 510Z is a tester that measures current by flowing current at high speed in the forward direction of the diode and connecting a forward recovery voltage and time with an oscilloscope. The speed of diF / dt is guaranteed 500 A / us.    Please click…