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Dynamic Characteristic Testers

Semiconductor dynamics evaluation system (TRANSISTOR, MOS-FET, IGBT, DIODE) SWRL 1510 ZZ

Semiconductor dynamics evaluation system (TRANSISTOR, MOS-FET, IGBT, DIODE) SWRL 1510 ZZ

It has application performance of 1 ms at 1500 V, 1000 A, and it has sufficient power as a dynamic characteristic test of power device. The measuring part takes into consideration the structure which can measure the device in the cooling or high temperature…
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Switching time & gate capacity test system (MOS-FET, IGBT) SWQR 550

Switching time & gate capacity test system (MOS-FET, IGBT) SWQR 550

In addition to R load switching time measurement, the SWQR 550 also has a gate capacity (QG) measurement function. However, because the importance is attached to the characteristics of each measurement, continuous measurement of R load switching and…
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Switching time tester (MOS-FET, IGBT) SWR 330 A

Switching time tester (MOS-FET, IGBT) SWR 330 A

SWR330A is an R load switching time measuring device for MOS-FET and IGBT, and by interlocking with the software, it judges pass / fail by taking in the waveform of the oscilloscope.    Please click for more information.
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