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Static test systems

4 terminal regulator test system (VOLTAGE REGULATOR, SHUNT REGULATOR) CCR03PE

4 terminal regulator test system (VOLTAGE REGULATOR, SHUNT REGULATOR) CCR03PE

CCR03PE is a measurement system for voltage regulator / shunt regulator, and it has 2 parallel specifications. Measurement accuracy is as high as 0.05%.    Please click for more information.
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Semiconductor test system (MOS-FET, IGBT, THYRISTOR, DIODE) CHT 3012 ZZ

Semiconductor test system (MOS-FET, IGBT, THYRISTOR, DIODE) CHT 3012 ZZ

It is the latest model of DC measuring tester for power semiconductor, and has the application capability of 3 kV - 1200 A The measuring table of the photo has a heater stage and it is possible to raise the temperature up to 200 ℃.    Please click for…
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Semiconductor test system (TRANSISTOR, MOS-FET, DIODE) CAT 1050 M / CAT 2050 SP

Semiconductor test system (TRANSISTOR, MOS-FET, DIODE) CAT 1050 M / CAT 2050 SP

The CAT series is a measuring instrument that tests the DC characteristics, and various types of voltage ranging from 500 V to 1500 V and current 10 A to 50 A are prepared. Also, models with 1500 V, 50 A or more can be supported by options. Measurement…
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Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z

Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z

It is a system developed as a wafer measuring instrument by prober and can measure DC characteristics and L load test at one place. Unit management is also possible for measurement programs and measurement results, as well as a wafer map function.  …
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Semiconductor test system (TRANSISTOR, MOS-FET, ZENER DIODE, PHOTO TRANSISTOR) CCT510NA

Semiconductor test system (TRANSISTOR, MOS-FET, ZENER DIODE, PHOTO TRANSISTOR) CCT510NA

CCT510NA is a DC tester developed for the production line, making measurement up to 3 stations possible. In addition, since it is possible to control up to 8 testers from a personal computer, measurement of up to 24 stations can be controlled from one…
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Waveform inspection test system (IGBT) WF 3000

Waveform inspection test system (IGBT) WF 3000

Measure backward withstand voltage waveform of IGBT and leak current of 3000V. The photo measurement head is a system with a 36 pin programmable scanner, but it can correspond to the measurement head as necessary.    Please click for more information.…
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